Bruker’s NanoWizard ® 4 XP BioScience atomic force microscope integrates atomic resolution, a wider scan range of 100 µm, and rapid scanning with rates of up to 150 lines/second into a single system.

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

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Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...