ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

A new technical paper titled “Novel Transformer Model Based Clustering Method for Standard Cell Design Automation” was published by researchers at Nvidia. “Standard cells are essential components of ...

A key limiting factor in standard cell based IC design is the standard cell library itself. This is because standard cell libraries don't offer the necessary variety of cells — in terms of ...

This article was originally published on ETFTrends.com. How can you ensure your robotic cell is efficient? A good place to start is to design a cell layout with these six essential properties. When ...

Manual and automated IC-layout tools are integrated in the PEYE Yield Finder analysis software. The combined yield-driven, standard-cell, design optimization flow facilitates the application of design ...

As integrated circuit (IC) designs continue to scale, the demand for efficient power management, performance optimization and reliable physical layout modification grows more critical. Meeting these ...