Topgraphy and frequency shift images of the ITP radical in constant-current mode. Courtesy : D Ebeling Ten years ago, researchers succeeded in significantly increasing the lateral resolution of low ...

Since the invention of atomic force microscopy (AFM) 1, it has had widespread application in non-destructive sample surface imaging and significant interest in its magnetic, electrical, and mechanical ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Photothermal AFM-IR, commonly referred to as AFM-IR, is an analytical technique used to understand the chemistry of a material at the nanoscale. It combines the nanoscale spatial resolution of atomic ...

Schematic illustration of Friction Force Microscopy (FFM). The AFM cantilever, a small diving board-like structure about 200 micrometers long, 50 micrometers wide, and 1 micrometer thick, has a sharp ...