Failures have been present in electronic products since the days of vacuum tubes, and despite enormous development and production improvements, no manufacturing technique can guarantee a 100% ...

The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...

Scandump is an advanced silicon debugging technique that ingeniously repurposes DFT (Design For Testability) scan chains for functional debugging. This method allows for the extraction of states from ...