In 2022, the dominating segment for computer vision (CV) was quality assurance and inspection because of the rapid adoption of process automation in the manufacturing industry. One of the key benefits ...
SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...
A technical paper titled “SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering” was published (preprint) by researchers at imec, University of Ulsan, and KU ...
Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...
Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.
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