ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

The post-synthesis gate-level netlist (GL-netlist) based PA simulation input requirements are mostly the same as RTL simulation. However, the design under verification here is the GL-netlist from ...

Standard cell libraries have been a mainstay of chip design for many decades since the inception of logic synthesis and composition methodologies. Cell library IP typically contains Verilog models ...

Traditional IC pattern-generation methods focus on detectingdefects at gate terminals or at interconnects. Unfortunately, a significantpopulation of defects may occur within an IC's gates, or cells.

Physical defects like shorts and opens may occur during any step of the fabrication process. Well-known fault models like stuck-at (SA), 1 transition (TR), 2 N-detect (ND), 3 gate-exhaustive (GE), 4 ...