Semicon West (July 11-15, San Francisco, CA) saw the demonstration of a variety of test probes, contactors, and sockets from Aries Electronics, Synergetix, Kulicke & Soffa, and Johnstech. Aries ...
San Francisco, CA. Combining six presentations from the Semiconductor Wafer Test and Burn-in and Test Socket workshops, a special TechXPOT session at Semicon West covered topics such as socket ...
Smiths Interconnect, a leading provider of innovative solutions for critical semiconductor test applications, and a business of Smiths Group, is pleased to announce that its patented, state-of-the-art ...
Smiths Interconnect, a leading provider of innovative solutions for critical semiconductor test applications, today announced the launch of DaVinci Gen V, the latest flagship product in its DaVinci ...
July 14, 2012. Aries Electronics announced in conjunction with Semicon West that it now offers a top-load burn-in socket that saves significant time and money (over conventional top-load sockets) for ...
As semiconductor devices continue to advance, the demand for reliable, high-performance test sockets has never been greater. Yet, traditional socket design validation methods—such as per-pin ...
Playing a crucial interconnect role in integrated circuits and semiconductor testing, test sockets, aka package probes, serve the role of connecting a device and its tester. IC sockets are categorized ...
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