Research from the Chin-Yi University of Technology in Taiwan revealed a novel heater design in the Czochralski silicon crystal growth process that can control and decrease oxygen concentration without ...

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

Partially defective, marginal die can still be functional enough to pass final electrical test. Some of these “walking wounded” chips get past final testing, but in the customer’s end product, under ...

What is the Market Size of Wafer Defect Inspection System? BANGALORE, India, Dec. 16, 2025 /PRNewswire/ -- In 2024, the global market size of Wafer Defect Inspection System was estimated to be worth ...

KLA leverages cutting-edge semiconductor inspection tech, partnering with industry leaders like TSMC and Samsung. This positions them to capitalize on the growing demand for 2nm and 3nm chip ...

SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...

The electrification of vehicles is fueling demand for silicon carbide power ICs, but it also is creating challenges in finding and identifying defects in those chips. Coinciding with this is a growing ...

Researchers from Zhejiang University in China have investigated the impact of impurities and defects on the performance of solar cells built with mono cast silicon (CM-Si) wafers and have found that ...

China's domestic equipment manufacturers have been making significant progress in the field of wafer cutting, gradually forming a new force and challenging the dominance of foreign equipment ...