The final, formatted version of the article will be published soon. In this study, it was aimed to establish a general reliability value for each statistics anxiety scale. For this purpose, Web of ...
Abstract: This study aimed to evaluate the reliability of Silicon Carbide (SiC) Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) under extremely high gate voltage stress. The research ...
Abstract: Power electronic converters are essential in modern electrical and electronic applications, necessitating the study on power electronic reliability for dependable design and operation. In ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results