Abstract: This paper presents an electron beam spot intensity distribution characterization method using suspended-nanomembrane-based spot measurement wafers, standard test patterns and a model for ...
Abstract: The integration of sensing and communication capabilities within a single platform is a significant advantage of sixth-generation (6G) communication systems. Multi-beam technology offers an ...
Nano Materials and Device Laboratory, Department of Physics, Visvesvaraya National Institute of Technology, South Ambazari Road, Nagpur, 440010 M.S., India ...
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