AYLESBURY, United Kingdom--(BUSINESS WIRE)--Nordson TEST & INSPECTION today announced that it will unveil the new Quadra 7 Pro Manual X-Ray Inspection (MXI) system at SEMICON China, scheduled to take ...

MINNEAPOLIS--(BUSINESS WIRE)--Nordson TEST & INSPECTION today announced its participation in SEMICON Taiwan, one of the most anticipated events in the semiconductor industry. The company will be ...

Sonoscan is the most trusted authority on the application of Acoustic Microscopy, also known as Acoustic Micro Imaging (AMI) technology for nondestructive internal inspection and analysis. Sonoscan’s ...

When examining the role of inspection in manufacturing test, you must look at both its costs and its benefits. Managers are notoriously unwilling to authorize the purchase of capital equipment without ...

WESTLAKE, OH—Nordson Corporation has acquired Optical Control GMBH, a designer and developer of high speed, fully automatic counting systems utilizing x-ray technology. This offering will expand ...

As the core technology used in modern electronics manufacturing, surface-mount technology (SMT) assembly density is increasing, the number of pins is increasing, and the pitch is decreasing. In ...

When a good die fails test and gets scrapped, often no one notices, because false failures look identical to real ones. Yet across the industry, these phantom defects are quietly eroding yield, ...

X-ray technology is moving into the mainstream of chip manufacturing as complex assemblies and advanced packaging make it increasingly difficult to ensure these devices will work as expected ...

WESTLAKE, Ohio--(BUSINESS WIRE)-- Nordson Corporation (Nasdaq: NDSN) has signed a definitive agreement for the acquisition of CyberOptics Corporation (Nasdaq: CYBE), a leading global developer and ...

Power transformers are one of the most critical and expensive assets in electric transmission and distribution. An in-service transformer failure can have far-reaching consequences: extended outages, ...

The new Quadra 7 Pro MXI system sets a new standard for 3D/2D manual inspection in back-end semiconductor applications. Powered by the revolutionary Onyx® detector technology, it delivers exceptional ...